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Ultrasonic force microscopy : ウィキペディア英語版 | Ultrasonic force microscopy
Ultrasonic Force Microscopy (UFM) has been developed in order to improve the details and image contrast on "flat" areas of interest where the atomic force microscopy (AFM) images are limited in contrast. The combination of AFM-UFM allows a near field acoustic microscopic image to be generated. The AFM tip is used to detect the ultrasonic waves and overcomes the limitation of wavelength that occurs in acoustic microscopy. By using the elastic changes under the AFM tip, an image of much greater detail than the AFM topography can be generated. ==Further reading==
*(Ultrasonic force microscopy for nanometer resolution subsurface imaging )
抄文引用元・出典: フリー百科事典『 ウィキペディア(Wikipedia)』 ■ウィキペディアで「Ultrasonic force microscopy」の詳細全文を読む
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